Prof. Zhiwei Shan was elected the director of the FIB Professional Committee of CEMS
According to the news announcement from the official website of the Chinese Electron Microscopy Society (CEMS) on March, 7th, a new professional committee, i.e. the FIB (Focused Ion Beam) Professional Committee was established in Beijing, China. Prof. Zhiwei Shan, the executive director of the CAMP-Nano and the director of HARCC, was elected as the director of the FIB Professional Committee of the CEMS. The FIB Professional Committee consists of twelve people, who are the excellent scholars on the realm of the FIB from universities or institutes in China. The establishment of such committee marked a new starting point of the utilization and the researches technology of the FIB in China. At the same time, Prof. Shan’s election of the director will encourage our campers to attain more achievements in relevant technology realms of the FIB.
Postscript: The detailed members list of the FIB Professional Committee of the CEMS
Director: Zhiwei Shan (Xi’an Jiaotong University)
Deputy Director: Jixue Li (Zhejiang University), Jun Xu (Peking University)
Members: Zhihong Jia, Xing Jin, Jixue Li, Jun Luo, Qiang Luo, Kaiwu Peng, Zhiwei Shan, Jun Tan, Qianjin Wang, Jun Xu, Zongwei Xu, Wei Zeng.
(Source: the official website of the CEMS;
Original website: http://www.china-em.net.cn/news_show.aspx?Nid=450&Ntype=6)
