School of Micro-electronics, Xi’an Jiaotong University
1272 Mailbox, No.28, Xianning West Road , Xi'an, Shaanxi, 710049, P.R. China
E-mail: pengchengzhangxx@gmail.com

 

EDUCATION

  • Sep.2008-July 2012 XI'AN JIAOTONG UNIVERSITY, Xi'an, P. R. China
    B.S. in Micro-Electronics, Xi’an Jiaotong University   
  • Sep.2012-July 2014 XI'AN JIAOTONG UNIVERSITY, Xi'an, P. R. China
    M.S. in Material Engineering, Xi’an Jiaotong University   
  • July 2014-present Engineer, Technical staff in School of Materials Science and Engineering (MSE), XI'AN JIAOTONG UNIVERSITY , in charge of the equipment repairing and maintenance in MES
SKILLS
  • Skilled in using OM, SEM
  • 3D drawing 
  • Practical experience in force and weak electricity
     
     so far, hosting or participating in 70+ large and middle scale equipment repairing, including 4 TEMs, 3 SEMs, 2 Ion Beam Millings, 1 FIB, 1 XRD, 1 Nanomill and so on, which saving a lot of instrument operating time and maintenance cost.
 
RESEARCH INTERESTS
  • 2012-2014   The Study of Electro Discharge in Mico-Nano scale
  • 2012-Present   The Preparation of Nanoscale metallic probe
  • 2014-2016   The SEM Analysis of Haze Particles in Xi’an, China
  • 2015-Present  New Materials and Device for Anti-Haze
  • 2015-Present   TEM holder design/ development/ application

Publications

  • Pengcheng Zhang, Pengtao Chai, Xinai Zhao1 and Zhiwei Shan# , New Attempts on Preparing Tungsten FIB Sample, Microsc. Microanal. , 2016, 22 (Suppl 3): 174-175
  • Clara Yuan Li, Mingshuai Ding#, Yang Yang, Pengcheng Zhang#, Yao Li, Yuecun Wang,Longchao Huang, Pingjiong Yang, Ming Wang, Xiao Sha, Yameng Xu,Chaowei Guo, Zhiwei Shan# , Portrait and Classification of Individual Haze Particulates, Journal of Environmental Protection, 2016, 9: 1355-1379
  • 付琴琴,张朋诚,单智伟*,一种基于聚焦离子束技术的环境透射电镜光阑清理方法,电子显微学报,2016,35(6):538 ~ 543
  • 付琴琴,张朋诚,单智伟*,环境透射电镜物镜光阑失效分析和修复,2015年全国电子显微学学术会议,中国,成都,2015.10.14-10.16
  • Patents: Shan Z.W.; Chen L.; Li, M.; Xie D.; Liu B.; Zhang P.C.; Wan J. An efficient method and automatic instrument to fabricate tungsten tips. (2012), Patent No. : ZL 201210044381
  • Patents: Shan Z.W.; Zhang P.C., Chen L.; Dai T.; Wang C.C.; A welding method for micro / nano-scale electrically conductive material. (2013), Patent No. : ZL 201310360044
  • Patents: Shan Z.W.; Zhang P.C. , Li M.; Zhang Z.M.; A Detachable TEM holder Design . (2016), Patent No. : ZL 201620387272.6

 Oral Talks

The Repairing of Environmental TEM Aperture Based on FIB-Tech, Zhang, P. C., Shan, Z.W., The Focus Ion Beam (FIB) Technical seminar of China, 2015,Beijing ,China