Introduction


The TI 950 combines Hysitron’s patented three plate capacitive transducer* technology with state-of-the-art control technology to achieve unmatched performance in nanomechanical characterization. The system features a sub 30 nN force noise floor, ultra-fast feedback control, user-definable data acquisition rates up to 30 kHz, the widest range of nanomechanical testing techniques, and the ability to test with various Hysitron heads seamlessly. The superior staging system on the TI 950, along with the in-situ Scanning Probe Microscopy (SPM) imaging capability, provides unparalleled precision in test-placement accuracy and data repeatability


specifications

  • Low Load Transducer

 

 

Z-Axis

X-Axis

Maximum Force

10mN

2mN

Load Resolution

1nN

3µN

Load Noise Floor

100nN

10µN

Maximum Displacement

5µm

15µm

Displacement Resolution

0.04nm

4nm

Displacement Noise Floor

0.2nm

10nm

Thermal Drift

<0.05nm/sec

<0.05nm/sec

 

 
  • High Load Transducer

 

Z-Axis

X-Axis

Maximum Force

150mN-10N

5N

Maximum Displacement

80µm

25mm