The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries.

The JEM-2100F has been developed to achieve the highest image quality and the highest analytical performance in the 200kV class analytical TEM with a probe size under 0.5nm. The new side-entry goniometer stage provides ease of use tilt, rotation, heating and cooling, programmable multi-point settings--all without mechanical drift. The JEM-2100F have been equipped with STEM, EDS, EELS, and CCD-cameras.


High-brightness Schottky Field Emission Electron Gun

Probe Size<0.2 nm

point-to-point TEM resolution is 0.23 nm

Bright Field and Annular Dark Field detector

Magnification: x50 to 1,500,000